Vaughn P. Gross is an INARTE certified Senior ESD Control Engineer. Vaughn’s many years of leading edge experience providing ESD services to industry stemming for his lead ESD Control engineering expertise for IBM ESD Labs. His leading edge experienced ESD services are HBM/MM/CDM/LU/TLP Characterization and Standard’s (MIL SPEC/JEDEC/ESDA/other) testing, ESD Materials Properties testing, (Mfg) Manufacturing & Development ESD equipment acceptance evaluations, Mfg Practices/internal Specifications/internal Standards document generation, ESD on site Audits/Problem Evaluations/Solutions against customer specifications and/or own best practices criteria, ESD Training and Consulting on ESD matters.
Vaughn graduated from Bellows Free Academy, St Albans, VT high school in 1961. In August 1961 joined the U.S. Navy and graduated from Electronics Schools. In 1964 Vaughn joined IBM and, in next few school semesters, completed all the technical courses to satisfy an Electrical Engineering Equivalency rating through a special "Students In Industry" program that through an IBM - University of Vermont collaboration. Throughout his 38 year career at IBM, completed many classes/seminars to build on his personal development and technical depth with emphasis in the Semiconductor sector.
Vaughn is a US Navy Veteran (Cuban Crisis, Dominion Republic uprising, Cyprus Greece Conflict, and Vietnam), serving in the electronics field, received an Honorable Discharge in August of 1964, and immediately started work at IBM (Burlington) located in Essex Junction Vermont. He retired from IBM (Burlington) Microelectronics in August 2002 (38 years service) as Staff Engineer/Scientist in the Reliability Engineering and Manufacturing Quality & Analytical Services organizations. He was a Team Leader and key member of IBM Microelectronics Manufacturing & Development Team for ESD, ESA, EMI, and EOS issue(s) resolutions. Throughout a distinguished career with IBM, he was the main author to developed and maintain IBM Microelectronics ESD Specifications, Standards, and manufacturing process procedures. In 1978 he set up and established the IBM Microelectronics ESD Laboratories offering services listed in the first paragraph. Vaughn developed test methods to test IC modules where pincount exceeded the number of tester channels available offering similar results as Military, JEDEC, ESDA and other standards.
Vaughn, also developed a Curve Trace method of Device ESD Characterization, by pin, that is still used today by many companies to assess devices ESD Sensitivity threshold.
Vaughn was a founding member of the IBM Corporate ESD Steering Committee; Chair of the IBM Microelectronics Worldwide ESD/ESA/EMI Defect Density Task Group; Chair/hosted IBM (internal) ESD Conferences and Educational Seminars; authored/coauthored numerous papers and Technical Reports on air ionization with patents for Clean Air Ionization and Laser Air Ionization; authored/coauthored several papers and Technical Reports on ESD Testing; ESD protection Circuits and ESD Factory and Field issues.
Vaughn was IBM Microelectronics representative for Mil Spec, JEDEC, and ESDA Standards Committee for issues on Device Testing. Since 1980, he has served on the ESDA EOS/ESD Symposium Technical Committee and several of the ESDA Standard’s Committees.
Vaughn has presented at many International Conferences, Symposiums, IBM & other company ESD conferences as an expert panelist and ESD Task Force participate/chair. Vaughn was an IBM Analytical Services ESD Consultant to outside companies on Manufacturing issues and ESD testing. Also, invited consultant to IBM, San Jose and worldwide Hard Disk Drive Division Task Force and Team Leader to fix all ESD related problems with MR Heads. Vaughn has received several Patents with Invention Plateau Awards from IBM and many other formal awards inside and outside of IBM. He was also recognized by the University of Arizona for participating in a seminar entitled “Microelectronics Facility Design for Submicron ULSI Chip Manufacturing.”
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