Finding Design Defects Using Time and Frequency Domain Techniques

One-half day "practical" class at NASA Ames Research Park

Speaker:  Douglas C. Smith
Venue:  RMV Technology Group, LLC

NASA-Ames Research Center
Bldg. 19, Suite 1073, 1st Floor
Moffett Field, CA 94035-0001

Telephone:  650.964.4792
SKYPE:  650.206-5797

Date:  September 16, 2010
Time:  1:00 PM to 4:00 PM

  Call Renee Mitchell at 650.964.4792 or email Renee at renee@esdrmv.comfor more information, make reservations.

Special price consideration for NASA NRP members and active military. 
  Class is limited to 6 persons per session.

                 To Get to Facility, go to Home Page and scroll down to bottom of page and see "Get Directions".

ABSTRACT and Outline
Have you ever had a hidden design issue on an IC device, PCB, or at the system level, cause problems during compliance testing or after equipment was put into service? Do you worry about hidden design flaws affecting the mission outcome or causing expensive field problems in commercial equipment? Do you need a quick quality check of a cable harness that has restricted access or can’t be visually inspected and that does not disturb the cable or its connectors? These topics and more are covered in this practical “hands-on” ½ day class onsite at RMV Technology Group HQ, NASA Ames Research Park, Moffett Field, CA.

 Integrated Circuit Noise Measurement
    How to measure noise, cross talk, and ground bounce inside the package with no direct connection
    How to gauge the impact of noise, cross talk and ground bounce in the package on IC operation   
    Identifying signal integrity problems including those that occur with very low probability
    Identifying EMC problems

 Resonant Frequency of Physical Structures
    How to measure structural resonance
    Needed equipment
    Several examples with data
    Kinds of operational and EMC problems that can be found
    Live demonstrations

Cable Harness Quality Check without  Visual Inspection
   Overview of method
   Live demonstration on test harness

Applications for commercial, military, and space vehicle applications
   Developing a test for a specific application – important considerations

Uncovering Design Flaws Through Controlled Stressing
   Tools used
   Technical background
   Time Domain techniques
        Stressing individual ports of equipment
              Tools
               Method
               Results
              Case histories
       Stressing PCBs and IC devices
                Tools
                Method
                Results
               Case histories
               Live demonstrations on test and operating PCBs
     Frequency domain techniques
             Tools
             Method
             Results
            Case histories