Summer
RMV Technology Group, LLC will present a group seminar with ESD-Expert Douglas Smith "Finding Design Defects Using Time and Frequency Domain Techniques" Upcoming Class Description Date: Summer 2011 Time: 1:00 PM to 4:00 PM Location: RMV Technology Group, LLC, Room 1073, Bldg. 19, Suite 1073, 1st Floor. For more information on special pricing for 2 or more persons, contact Renee Mitchell at renee@esdrmv.com or call 650.964.4792.
About the Speaker
Mr. Smith's career has spanned over five decades and has been in electrical engineering over 40 years. He lectures at Oxford University, UC Santa Barbara, Cal Poly San Luis Obispo, UC Berkeley and Vanderbilt University. His experience includes 26 years at AT&T Bell Labs in New Jersey, four years as manager of EMC and Compliance Test at Auspex Systems, and ten years as an engineering consultant. In his classes, Doug makes complex subjects easy to understand and use in everyday work.
Abstract
Have you ever had a hidden design issue on an IC device, PCB, or at the system level, cause problems during compliance testing or after equipment was put into service? Do you worry about hidden design flaws affecting the mission outcome or causing expensive field problems in commercial equipment? Do you need a quick quality check of a cable harness that has restricted access or can’t be visually inspected and that does not disturb the cable or its connectors? These topics and more are covered in this practical “hands-on” ½ day class at NASA Ames Research Park.
Integrated Circuit Noise Measurement
· How to measure noise, crosstalk, and ground bounce inside the package with no direct connection
· How to gauge the impact of noise, crosstalk, and ground bounce in the package on IC operation
· Identifying signal integrity problems including those that occur with very low probability
· Identifying EMC problems
Resonant Frequency of Physical Structures
· How to measure structural resonance
· Needed equipment
· Several examples with data
· Kinds of operational and EMC problems that can be found
· Live demonstrations
Cable Harness Quality Check w/o Visual Inspection
· Overview of method
· Live demonstration on test harness
· Applications for commercial, military, and space vehicle applications
· Developing a test for a specific application – important considerations
Uncovering Design Flaws Through Controlled Stressing
· Tools used
· Technical background
· Time Domain techniques
o Stressing individual ports of equipment
§ Tools
§ Method
§ Results
§ Case histories
o Stressing PCBs and IC devices
§ Tools
§ Method
§ Results
§ Case histories
§ Live demonstrations on test and operating PCBs
0 Frequency domain techniques
§ Tools
§ Method
§ Results
§ Case histories
