SYSTEM LEVEL TEST
HBM
HUMAN BODY MODEL
IEC-61000-4-2
ESD STANDARD FOR SYSTEM LEVEL TESTING
MM
MACHINE MODEL
IEC-61000-4-5
ESD STANDARD FOR
SURGE IMMUNITY
CDE
CDM
CABLE DISCHARGE EVENT
CHARGED DEVICE MODEL
System Level Testing from Assemblies to Hybrid Electronics
RMV Technology Group has built an international reputation in a diversified Industry Sector due to the practical hands on solutions driven technological expertise of our scientific and engineering staff of talent that have the capability to adapt and to reliably defend test methods that are "out of the box" and conform to Industry parameters of current test methods.
Due to the increased sophistication and densification of components, a parallel increase of ESD susceptibility becomes an inherent by-product of our innovation.
With the utilization of the most sophisticated test equipment and real time software, our tech driven focus works to your advantage in test and evaluation, troubleshooting and resolution of issues that may take much longer to solve without our focused and solutions driven support.
Our practical approach to bring an idea or concept to a tangible solution has placed RMV in the very unique position to work with Government and Industry in a more holistic approach to solve problems without additional costs to the customer for defensible solutions.
Cable Discharge Event (CDE)
A cable discharge event is an ESD (electrostatic discharge) event that happens when a cable acquires a static charge and then is connected to a piece of electronic equipment. In the field, cables can become charged to different voltages over different parts of the insulating jacket, making for a complicated discharge event
RMV Technology Group has built an international reputation in a diversified Industry Sector due to the practical hands on solutions driven technological expertise of our scientific and engineering staff of talent that have the capability to adapt and to reliably defend test methods that are "out of the box" and conform to Industry parameters of current test methods.
Real Time Recording of ESD Events & Fields
Susceptible Components
RMV leadership provides test and evaluation for components, assemblies and market ready products (above the technician level) including device testing and troubleshooting for device failures. Moreover, we provide recommendations for solutions to our customers.
1. Basic System Level Testing to IEC 61000-4-2 (or your requirements) for
Pass/Fail Lab Testing
2. Basic System Level Testing at each Test Point or Test to the Failure Level or
Pre-Determined Level above the Standard Test Level.
3. We can also test at each point if the Standard Test is passed.
Sensitive Devices that we test may include:
1. MOSFET transistors
2. CMOS ICs (chips), integrated circuits built with MOSFETS
3. Computer Cards
4. LEDs (Light-emitting diodes)
5. LCDs (Military Applications in particular)
6. Resistors (high precision)
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