or email   renee@esdrmv.com  

RMV Technology Group LLC
NASA Research Park
350 N. Akron Road, B-19
Room 1073
Moffett Field, CA 94035
T  650-964-4792
F  650-964-1268
www.esdrmv.com 
www.esdaerospacetraining.org 
And Find us on GOOGLE MAPS

SYSTEM LEVEL TEST 

HBM

HUMAN BODY MODEL

IEC-61000-4-2

ESD STANDARD FOR SYSTEM LEVEL TESTING 

MM

MACHINE MODEL  

IEC-61000-4-5

ESD STANDARD FOR

SURGE IMMUNITY 

CDE

CDM

CABLE DISCHARGE EVENT   

CHARGED DEVICE MODEL

System Level Testing from Assemblies to Hybrid Electronics

 
RMV Technology Group has  built an international reputation in a diversified Industry Sector due to the practical hands on  solutions driven technological expertise of our scientific and engineering staff of talent that have the capability to adapt and to reliably defend test methods that are "out of the box" and conform to  Industry parameters of current test methods. 
 
Due to the increased sophistication and densification of components, a parallel increase of ESD susceptibility becomes an inherent by-product of our innovation.
With the utilization of the most sophisticated test equipment and  real time software, our tech driven  focus works to your advantage  in test and evaluation, troubleshooting and resolution of issues that may take much longer to solve without our focused and solutions driven support. 
 
Our practical approach to bring an idea or concept to a tangible solution has placed RMV in the very unique position to work with Government and Industry in a more holistic approach to solve problems without additional costs to the customer for defensible solutions.

Cable Discharge Event (CDE)

 
A cable discharge event is an ESD (electrostatic discharge) event that happens when a cable acquires a static charge and then is connected to a piece of electronic equipment.  In the field, cables can become charged to different voltages over different parts of the insulating jacket, making for a complicated discharge event
 
RMV Technology Group has  built an international reputation in a diversified Industry Sector due to the practical hands on  solutions driven technological expertise of our scientific and engineering staff of talent that have the capability to adapt and to reliably defend test methods that are "out of the box" and conform to  Industry parameters of current test methods. 
 

Real Time Recording of ESD Events & Fields

Susceptible Components

RMV leadership provides test and evaluation for components, assemblies and market ready products (above the technician level) including device testing and  troubleshooting for device failures.  Moreover, we provide recommendations for solutions to our customers.

        1.  Basic System Level Testing to IEC 61000-4-2 (or your requirements) for

             Pass/Fail Lab Testing

        2.  Basic System Level Testing at each Test Point or Test to the Failure Level or

             Pre-Determined Level above  the Standard Test Level.

        3.  We can also test at each point if the Standard Test is passed.

 Sensitive Devices that we test may include:

​ 

        1.  MOSFET transistors 

        2.  CMOS ICs (chips), integrated circuits built with MOSFETS

        3.   Computer Cards

        4.   LEDs (Light-emitting diodes)

        5.   LCDs (Military Applications in particular) 

        6.   Resistors (high precision)

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